The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Dec. 25, 2013
Chang Zhou Current Supply Company of Jiangsu Electric Power Company, Changzhou, CN;
Jiangsu Electric Power Company, Nanjing, CN;
State Grid Corporation of China, Beijing, CN;
Zhen Xu, Changzhou, CN;
Yi Wang, Changzhou, CN;
Shu Chen, Changzhou, CN;
Zuchen Dong, Changzhou, CN;
Liang Cao, Changzhou, CN;
CHANG ZHOU CURRENT SUPPLY COMPANY OF JIANGSU ELECTRIC POWER COMPANY, Changzhou, CN;
JIANGSU ELECTRIC POWER COMPANY, Nanjing, CN;
STATE GRID CORPORATION OF CHINA, Beijing, CN;
Abstract
The present invention provides an intelligent calibration system for backup-power automatic switching devices, including a power supply module, a control module for logic controls, a voltage output module and a current output module for outputting simulated voltage and current, a signal feedback module for sampling outputted voltage and current signals, a simulated circuit-breaker group, an auxiliary relay, a USB interface for communication, a keyboard for information input, a display module for information interaction and real-time panel presentation, an interface module to facilitate plug-in wires, an indicator light for indicating operation status and a computer for controlling the testing globally. The present invention facilitates easy and fast wiring, and conveniently displays operation interface and related information. The operation is intuitive and simple, overall test efficiency is improved. Further, comprehensive tests for BAS devices can be performed with high measurement accuracy, while avoiding influences of human operations to the test results.