The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Nov. 26, 2013
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Daniel Chatroux, Teche, FR;

Sebastien Carcouet, Vif, FR;

Julien Dauchy, Moirans, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/14 (2006.01); G01R 27/18 (2006.01); G01R 31/02 (2006.01); B60L 3/00 (2006.01); B60L 3/04 (2006.01); B60L 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/14 (2013.01); B60L 3/0046 (2013.01); B60L 3/0069 (2013.01); B60L 3/04 (2013.01); B60L 11/1803 (2013.01); B60L 11/1864 (2013.01); G01R 27/18 (2013.01); G01R 31/025 (2013.01); B60L 2240/547 (2013.01); B60L 2250/10 (2013.01); B60L 2270/145 (2013.01); Y02T 10/7005 (2013.01); Y02T 10/7011 (2013.01); Y02T 10/7061 (2013.01);
Abstract

An electrical power supply includes DC source outputting Vm and a device that detects insulation defects in the DC source. The device includes input terminals connected to the source's terminals, impedances Z1 and Z2 connected in series between the input terminals, where Z1=Z2=Z and Vm/Imax<z<(3/2)*Vm/Imax, wherein Imax is a maximum insulation defect current defined by a standardized safety threshold, and a current-detection circuit connected between ground and an intermediate point between the impedances. The current-detection circuit includes a microcontroller that receives a voltage proportional to the defect current originating from the intermediate point, the input terminal being connected by Z3 to a power supply with Vcc<Vm, the input terminal being connected to ground by way of Z4. The microcontroller is configured to determine amplitude of an insulation defect as a function of the voltage applied to the input terminal, wherein Z*Vcc/(4*Vm)<(Z3,Z4)<Ztmax=Z*Vcc/2Vm.


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