The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Aug. 06, 2014
Applicant:

Applied Optoelectronics, Inc., Sugar Land, TX (US);

Inventors:

Luohan Peng, Cypress, TX (US);

Darren Tucker, Houston, TX (US);

Justin Lii, Houston, TX (US);

David Hendricks, Magnolia, TX (US);

Assignee:

Applied Optoelectronics, Inc., Sugar Land, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/44 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/44 (2013.01); G01R 1/06722 (2013.01);
Abstract

A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.


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