The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jun. 19, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Chao Liu, Irvine, CA (US);

Sandra Skaff, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G06N 99/00 (2010.01); G06K 9/20 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G06K 9/209 (2013.01); G06K 9/2018 (2013.01); G06K 9/628 (2013.01); G06N 99/005 (2013.01); G01N 2201/0627 (2013.01); G01N 2201/129 (2013.01);
Abstract

Material classification using multiplexed illumination by broadband spectral light from multiple different incident angles, coupled with multi-spectral narrow band spectral measurement of light reflected from the illuminated object of unknown material, wherein selection of spectral bands for illumination or for narrow-band capture may comprise analysis of a database of labeled training material samples within a multi-class classification framework, captured using a relatively large number of spectral bands (such as 32 spectral bands), so as to select a subset of a relatively fewer number of spectral bands (such as 5 spectral bands), wherein the selected spectral bands in the subset retain a significant aptitude for distinguishing between different classifications of materials.


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