The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Dec. 02, 2014
Applicant:

Mettler-toledo Ag, Greifensee, CH;

Inventors:

Chun-Hung Kuo, Alexandria, VA (US);

Tomasz Pol, Severna Park, MD (US);

Mario Crevatin, Winterthur, CH;

Assignee:

METTLER-TOLEDO GMBH, Greifensee, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/25 (2006.01); G01N 21/03 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); G01N 21/01 (2013.01); G01N 21/0303 (2013.01); G01N 2021/035 (2013.01); G01N 2021/036 (2013.01); G01N 2021/0314 (2013.01); G01N 2021/0364 (2013.01);
Abstract

An apparatus and a method are disclosed for performing a light-absorption measurement of a specified amount of sample. A method for performing a light-absorption measurement of a specified amount of sample includes placing the sample on the surface of an apparatus including the surface and a light reflector, the light reflector being mechanically coupled with the surface and separated from the surface by a separation distance, changing the separation distance, while the light reflector remains mechanically coupled with the surface, to a first separation distance, and performing a first light-absorption measurement of the sample via the apparatus, while the separation distance is equal to the first separation distance, and while the sample is subject to pressure force.


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