The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jun. 05, 2014
Applicants:

Jiangang HU, Grafton, WI (US);

Lixiang Wei, Mequon, WI (US);

Zhijun Liu, Menomonee Falls, WI (US);

Jeffrey D. Mcguire, Franklin, WI (US);

Inventors:

Jiangang Hu, Grafton, WI (US);

Lixiang Wei, Mequon, WI (US);

Zhijun Liu, Menomonee Falls, WI (US);

Jeffrey D. McGuire, Franklin, WI (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/08 (2006.01); H02H 3/16 (2006.01); B60L 3/00 (2006.01); H02H 1/00 (2006.01); H02P 29/032 (2016.01); H02P 29/024 (2016.01); H02M 1/32 (2007.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
B60L 3/0069 (2013.01); G01R 31/025 (2013.01); G01R 31/08 (2013.01); H02H 1/0092 (2013.01); H02H 3/16 (2013.01); H02P 29/0241 (2016.02); H02P 29/032 (2016.02); G01R 31/086 (2013.01); G01R 31/40 (2013.01); H02M 1/32 (2013.01); Y02T 10/642 (2013.01);
Abstract

Methods an apparatus are presented for identifying ground fault locations in multi-drive systems in which individual drives perform self-diagnosis for detected faults based on an identified fault signal frequency while the system drives continue operation, and a ground fault location system identifies suspected drives and individually confirms or exonerates individual drives by selective command speed adjustment while the drives remain operational within system tolerance ranges.


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