The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Aug. 02, 2011
Applicants:

Jeffrey D Brown, Sheboygan, WI (US);

Dennis J Faucher, Sheboygan, WI (US);

Jeffrey W Fritz, Plymouth, WI (US);

Gottfried J Hohm, Sheboygan Falls, WI (US);

Adam D Denoble, De Pere, WI (US);

Ryan M Ferguson, Sheboygan, WI (US);

Inventors:

Jeffrey D Brown, Sheboygan, WI (US);

Dennis J Faucher, Sheboygan, WI (US);

Jeffrey W Fritz, Plymouth, WI (US);

Gottfried J Hohm, Sheboygan Falls, WI (US);

Adam D DeNoble, De Pere, WI (US);

Ryan M Ferguson, Sheboygan, WI (US);

Assignee:

Curt G. Joa, Inc., Sheboygan Falls, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 13/15 (2006.01); B65H 23/032 (2006.01);
U.S. Cl.
CPC ...
A61F 13/15772 (2013.01); A61F 13/15804 (2013.01); B65H 23/032 (2013.01); A61F 2013/15796 (2013.01);
Abstract

Apparatus and methods are provided to minimize waste and improve quality and production in web processing operations. The apparatus and methods provide defect detection both before and after application of component patches to a traveling web to create a product. Web defect detection may be provided by way of at least one visual inspection station located upstream from the patch applicator. Patch defect detection may be accomplished by way of a visual inspection station located proximate the patch applicator. If defects are detected in either the traveling web or the component patch prior to patch application, patch application may be prevented until both a satisfactory web and patch are provided. If defects are detected after patch application, the resulting product may be culled. Furthermore, the apparatus may be provided with diagnostic software to warn against extant or imminent machine complications.


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