The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Dec. 22, 2011
Applicants:

Christian Rathjen, Bremen, DE;

Holger Lubatschowski, Gehrden, DE;

Tammo Ripken, Wunstorf, DE;

Inventors:

Christian Rathjen, Bremen, DE;

Holger Lubatschowski, Gehrden, DE;

Tammo Ripken, Wunstorf, DE;

Assignee:

ROWIAK GMBH, Hannover, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 18/18 (2006.01); A61F 9/008 (2006.01); A61B 18/04 (2006.01); A61B 8/10 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00806 (2013.01); A61F 9/00825 (2013.01); A61B 8/10 (2013.01); A61F 2009/00851 (2013.01); A61F 2009/00855 (2013.01);
Abstract

A device for processing material of a workpiece, the device including a pulsed processing laser, a focusing lens, a beam-deflection unit, a control unit and a confocal detector unit. The intensity of the laser radiation is variable. An imaging unit is provided to detect structures within the workpiece using electromagnetic radiation, wherein the electromagnetic radiation of the imaging unit is radiated via the beam-deflection unit and the focusing lens into the workpiece, and evaluating device is provided and compares the position of the focus of the laser radiation determined by the detector unit with the expected position of the focus in the image of the workpiece obtained by the imaging unit.


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