The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Apr. 23, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon, KR;

Inventors:

Ki-wan Choi, Anyang, KR;

Ji-young Park, Yongin, KR;

Hyoung-ki Lee, Seongnam, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); G01S 15/89 (2006.01); G01S 7/52 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); G01S 7/52042 (2013.01); G01S 15/8918 (2013.01); A61B 8/4494 (2013.01); A61B 8/5223 (2013.01);
Abstract

A method of analyzing elastography of tissue using a one-dimensional (1D) ultrasound probe. The method includes: acquiring two-dimensional (2D) ultrasound images with respect to a region of interest (ROI) of an object to be diagnosed, to which a shear wave is induced, using the 1D ultrasound probe; measuring a displacement of the shear wave from the acquired 2D ultrasound images; estimating a change rate in the displacement of the shear wave along a y-axis direction orthogonal to a 2D plane on which the 2D ultrasound images are shown, using the measured displacement; and analyzing elastography information of tissue in the ROI using the measured displacement and the estimated displacement change rate.


Find Patent Forward Citations

Loading…