The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Jun. 13, 2014
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hyun Hwa Oh, Hwaseong-si, KR;
Dong Goo Kang, Hwaseong-si, KR;
Sung Hoon Kang, Suwon-si, KR;
Young Hun Sung, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Abstract
An X-ray imaging apparatus and control method for the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes an X-ray source to generate X-ray beams, and to irradiate the X-ray beams onto an object; a first X-ray detector configured to detect X-ray beams transmitted through the object and generate a first phase contrast signal; an X-ray obtainer including an X-ray collimator and a second X-ray detector, wherein the X-ray collimator is spaced apart from the object by a predetermined distance, and configured to focus the X-ray beams transmitted through the object, and wherein the second X-ray detector is configured to detect the focused X-ray beams and generate a second phase contrast signal based on the detected X-ray beams; and an image processor configured to create a phase contrast image and an absorption image of the object.