The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Apr. 02, 2012
Applicants:

Atsushi Yamaguchi, Osaka, JP;

Hisahiko Yoshida, Osaka, JP;

Arata Kishi, Nara, JP;

Naomichi Ohashi, Hyogo, JP;

Inventors:

Atsushi Yamaguchi, Osaka, JP;

Hisahiko Yoshida, Osaka, JP;

Arata Kishi, Nara, JP;

Naomichi Ohashi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/00 (2006.01); H05K 13/04 (2006.01); H01L 23/00 (2006.01); H05K 3/34 (2006.01); H05K 1/18 (2006.01); H05K 1/14 (2006.01);
U.S. Cl.
CPC ...
H05K 13/0465 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H05K 1/181 (2013.01); H05K 3/3436 (2013.01); H01L 24/13 (2013.01); H01L 2224/10126 (2013.01); H01L 2224/13111 (2013.01); H01L 2224/16058 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/8149 (2013.01); H01L 2224/8159 (2013.01); H01L 2224/81192 (2013.01); H01L 2224/81193 (2013.01); H01L 2224/81411 (2013.01); H01L 2224/81413 (2013.01); H01L 2224/81613 (2013.01); H01L 2224/81815 (2013.01); H01L 2224/81862 (2013.01); H01L 2224/81885 (2013.01); H01L 2924/014 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01049 (2013.01); H01L 2924/01322 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/15788 (2013.01); H01L 2924/19105 (2013.01); H01L 2924/20106 (2013.01); H01L 2924/351 (2013.01); H05K 1/141 (2013.01); H05K 3/3463 (2013.01); H05K 2201/10977 (2013.01); H05K 2203/047 (2013.01); Y02P 70/613 (2015.11);
Abstract

In a case where a first mounted substrate to which a semiconductor element is bounded by solder is mounted on a second substrate, connection strength becomes low, when the first mounted substrate is bonded to the second substrate by using a solder having a low melting point. A mounted structure, in which a first mounted substrate on which a semiconductor element is bonded by using a first solder having a melting point of 217° C. or more, is mounted on a second substrate, includes plural bonding parts bonding the first mounted substrate to the second substrate; and a reinforcing member formed around the bonding part. Each of the bonding parts contains a second solder having a melting point, that is lower than the melting point of the first solder, and a space exists, in which the reinforcing members do not exist, between the bonding parts neighboring each other.


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