The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Jan. 30, 2015
Innowireless Co., Ltd., Gyeonggi-do, KR;
Jin Soup Joung, Gyeonggi-do, KR;
Sung Chan Choi, Gyeonggi-do, KR;
Yong Hoon Lim, Seoul, KR;
Byung Kwan Jang, Gyeonggi-do, KR;
INNOWIRELESS CO., LTD., , KR;
Abstract
An apparatus for efficiently and simply measuring an error vector magnitude (EVM) of a physical hybrid automatic repeat request (ARQ) indicator channel (PHICH) in a long term evolution (LTE) system. The apparatus includes an overall PHICH group data extraction unit configured to extract all PHICH group data from a received signal in a first subframe, an overall PHICH group analysis unit configured to detect orthogonal sequences and acknowledgement/negative acknowledgement (ACK/NACK) bits used in respective PHICH groups by analyzing all resources of the extracted PHICH group data, an ideal PHICH group sequence generation unit configured to generate an ideal PHICH group sequence using the detected ACK/NACK bits and orthogonal sequences, and an EVM measurement unit configured to measure an EVM of a PHICH using the ideal PHICH group sequence and the received signal.