The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Mar. 14, 2013
Applicant:
Advanced Rf Technologies, Inc., Burbank, CA (US);
Inventor:
Young-Hoon Ko, Icheon, KR;
Assignee:
ADVANCED RF TECHNOLOGIES, INC., Burbank, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04B 7/02 (2006.01); H04W 24/04 (2009.01); H04W 88/08 (2009.01); H04B 17/23 (2015.01); H04B 17/345 (2015.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04B 7/024 (2013.01); H04B 17/23 (2015.01); H04B 17/345 (2015.01); H04W 24/04 (2013.01); H04W 88/085 (2013.01);
Abstract
A method of automatically measuring noise levels of a plurality of uplink paths in a Distributed Antenna System (DAS) includes: sequentially measuring a noise level of each uplink path of the plurality of uplink paths; extracting the noise level of each uplink path at a final end of the uplink path; detecting the noise level of each uplink path; and determining a status of each uplink path by comparing the detected noise level with a threshold value.