The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Dec. 18, 2014
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Hui Zhang, Princeton Junction, NJ (US);

Junghwan Rhee, Princeton, NJ (US);

Nipun Arora, Plainsboro, NJ (US);

Cristian Lumezanu, Princeton Junction, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0631 (2013.01); H04L 41/069 (2013.01); H04L 41/14 (2013.01); H04L 43/0858 (2013.01);
Abstract

A computer implemented method for network monitoring includes providing network packet event characterization and analysis for network monitoring that includes supporting summarization and characterization of network packet traces collected across multiple processing elements of different types in a virtual network, including a trace slicing to organize individual packet events into path-based trace slices, a trace characterization to extract at least 2 types of feature matrix describing those trace slices, and a trace analysis to cluster, rank and query packet traces based on metrics of the feature matrix.


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