The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Apr. 21, 2014
Applicant:

Sandisk Enterprise Ip Llc, Dallas, TX (US);

Inventors:

Xinmiao Zhang, Seattle, WA (US);

Ying Yu Tai, Mountain View, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/616 (2013.01); H03M 13/1102 (2013.01); H03M 13/114 (2013.01); H03M 13/116 (2013.01); H03M 13/1111 (2013.01); H03M 13/6502 (2013.01); G11C 2029/0411 (2013.01);
Abstract

High-speed multi-block-row layered decoding for low density parity check (LDPC) codes is disclosed. In a particular embodiment, a method, in a device that includes a decoder configured to perform an iterative decoding operation, includes processing, at the decoder, first and second block rows of a layer of a parity check matrix simultaneously to generate a first output and a second output. The method includes performing processing of the first output and the second output to generate a first result of a first computation and a second result of a second computation. A length of a 'critical path' of the decoder is reduced as compared to a critical path length in which a common feedback message is computed.


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