The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Nov. 24, 2011
Applicants:

Helmut Lipp, Dörzbach-Hohebach, DE;

Ralph Wystup, Künzelsau, DE;

Fabian Schneider, Rot am See, DE;

Sebastian Schroth, Kupferzell, DE;

Inventors:

Helmut Lipp, Dörzbach-Hohebach, DE;

Ralph Wystup, Künzelsau, DE;

Fabian Schneider, Rot am See, DE;

Sebastian Schroth, Kupferzell, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02P 6/14 (2016.01); H03K 17/16 (2006.01); H02P 6/08 (2016.01); H02P 27/06 (2006.01);
U.S. Cl.
CPC ...
H02P 6/14 (2013.01); H03K 17/166 (2013.01); H02P 6/085 (2013.01); H02P 27/06 (2013.01); Y02T 10/7005 (2013.01);
Abstract

An electronic circuit comprises at least one semiconductor switch mounted with its switching path in series with an inductive load to be triggered, and at least one freewheeling element that interacts with the semiconductor switch during switching phases and is also mounted in series with the load. A control unit controls a control connection of the semiconductor switch with a variable control current as a function of the time profile of a voltage measured at the freewheeling element and/or as a function of the time profile of the voltage measured at the switching path. A method for triggering a semiconductor switch of such a circuit, triggered by a variable control current for switching, the control current predefined as a function of the time profile of a voltage measured at the freewheeling element and/or as a function of the time profile of the voltage measured at the switching path.


Find Patent Forward Citations

Loading…