The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Nov. 06, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Satoko Itaya, Tokyo, JP;

Peter Davis, Kyoto, JP;

Naoki Yoshinaga, Tokyo, JP;

Rie Tanaka, Tokyo, JP;

Taku Konishi, Tokyo, JP;

Shinichi Doi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08G 1/01 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G08G 1/0125 (2013.01); G06F 17/50 (2013.01); G08G 1/0108 (2013.01);
Abstract

An assessment device () includes: a request acquirer () that accepts an evaluation target from a user terminal (); a model acquirer () and a data acquirer () that select a main model for evaluating the evaluation target accepted by the request acquirer () from a plurality of models and select supplemental data to be supplemented for using the main model (data to be input into the main model, a sub-model, or data to be input into the sub-model) when the data to be input into the main model is insufficient; an executor () that evaluates the evaluation target based on the main model and supplemental data selected by the model acquirer () and the data acquirer (); and a transmitter () that provides a result of the evaluation by the executor () to the outside.


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