The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Sep. 27, 2013
Emc Corporation, Hopkinton, MA (US);
Eyal Gruss, Herzliya, IL;
Alex Vaystikh, Hod Hasharon, IL;
Eyal Kolman, Tel Aviv, IL;
Alon Kaufman, Bnei-Dror, IL;
Yael Villa, Tel Aviv, IL;
Ereli Eran, Tel Aviv, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
A technique provides alert prioritization. The technique involves selecting attributes to use as alert scoring factors. The technique further involves updating, for an incoming alert having particular attribute values for the selected attributes, count data to represent encounter of the incoming alert from perspectives of the selected attributes. The technique further involves generating an overall significance score for the incoming alert based on the updated count data. The overall significance score is a measure of alert significance relative to other alerts. Scored alerts then can be sorted so that investigators focus on the alerts with the highest significance scores. Such a technique is well suited for adaptive authentication (AA) and Security Information and Event Management (SIEM) systems among other alert-based systems such as churn analysis systems, malfunction detection systems, and the like.