The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Dec. 20, 2013
Applicant:
Alcatel-lucent Usa Inc., Murray Hill, NJ (US);
Inventors:
Raziel Haimi-Cohen, Springfield, NJ (US);
Hong Jiang, Warren, NJ (US);
Assignee:
Alcatel Lucent, Boulogne-Billancourt, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/20 (2006.01); G06T 7/00 (2006.01); H03M 7/30 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/2033 (2013.01); G06K 9/00744 (2013.01); G06K 9/00771 (2013.01); G06K 9/4604 (2013.01); G06K 9/4642 (2013.01); G06K 9/6232 (2013.01); G06T 7/0085 (2013.01); G06T 7/204 (2013.01); G06T 7/206 (2013.01); H03M 7/3062 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30232 (2013.01); G06T 2207/30241 (2013.01);
Abstract
A measurement vector of compressive measurements is received. The measurement vector may be derived by applying a sensing matrix to a source signal. At least one first feature vector is generated from the measurement vector. The first feature vector is an estimate of a second feature vector. The second feature vector is a feature vector that corresponds to a translation of the source signal. An anomaly is detected to in the source signal based on the first feature vector.