The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Oct. 09, 2013
Kabushiki Kaisha Topcon, Itabashi-ku, JP;
Hitoshi Shimizu, Itabashi-ku, JP;
Takashi Fujimura, Fujiminio, JP;
KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;
Abstract
An optical image measuring apparatus including an optical system, image forming part, controller, and composite-cross-sectional-image forming part. The optical system includes a scanner changing an irradiation position of signal light on an object and a focus position changing part changing a focus position of the signal light. The optical system detects interference light of returned light of the respective signal light from the object and reference light. The image forming part forms a cross-sectional image based on detection results of plural interference light corresponding to plural irradiation positions of the signal light. The controller controls the optical system to irradiate the signal light onto the plural irradiation positions repeatedly while changing focus position. The composite-cross-sectional-image forming part forms one composite cross-sectional image based on two or more of the cross-sectional images based on results of repetitive irradiation of the signal light.