The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Nov. 07, 2013
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Bernhard Johannes Brendel, Norderstedt, DE;
Gilad Shechter, Haifa, IL;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 11/005 (2013.01); G06K 9/00 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30004 (2013.01);
Abstract
This application describes an approach to filter, solely in the projection domain, correlated noise from (or de-noise) spectral/multi-energy projection data. As described herein, this can be achieved based at least on variances of the basis material line integrals and a covariance there between, based on multiple correlation coefficients and hyper-planes that describe the noise correlation between different basis material line integrals, and/or otherwise.