The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Jan. 29, 2016
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Jeannette M. Ross, Lake Wylie, SC (US);

Shilpi Choudhari, Hyderabad, IN;

Priyanka Kapoor, New Delhi, IN;

Tomy Victor Pathrose, Tamil Nadu, IN;

Antonio J. Kinney, Charlotte, NC (US);

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 10/06 (2012.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06395 (2013.01); G06F 17/30864 (2013.01); H04L 63/08 (2013.01); H04L 63/10 (2013.01);
Abstract

An apparatus for assessing and controlling the quality of a project in a production environment is provided. The apparatus is configured to: receive a first score, wherein the first score comprises a first numerical value associated with a first level of quality, wherein the first level of quality is associated with a first deliverable; receive a second score, wherein the second score comprises a second numerical value associated with a second level of quality, wherein the second level of quality is associated with the first deliverable; and process the first score and the second score to generate a third score.


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