The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Jan. 31, 2011
Applicants:

James M. Bogusky, Poughkeepsie, NY (US);

Mary Ann Emmett, Poughkeepsie, NY (US);

Donald A. Hallock, Poughkeepsie, NY (US);

Arden Steuart Lake, Poughkeepsie, NY (US);

Joseph Paul Palmeri, Poughkeepsie, NY (US);

James I. Paradies, Poughkeepsie, NY (US);

William Madison Sipperley, Poughkeepsie, NY (US);

Inventors:

James M. Bogusky, Poughkeepsie, NY (US);

Mary Ann Emmett, Poughkeepsie, NY (US);

Donald A. Hallock, Poughkeepsie, NY (US);

Arden Steuart Lake, Poughkeepsie, NY (US);

Joseph Paul Palmeri, Poughkeepsie, NY (US);

James I. Paradies, Poughkeepsie, NY (US);

William Madison Sipperley, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06Q 50/04 (2012.01); G06K 9/62 (2006.01); G06F 9/44 (2006.01); G05B 19/042 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G06Q 50/04 (2013.01); G05B 19/0426 (2013.01); G05B 2219/23258 (2013.01); G06F 8/34 (2013.01); G06F 8/75 (2013.01); G06K 9/00355 (2013.01); G06K 9/6253 (2013.01); Y02P 90/30 (2015.11);
Abstract

This disclosure relates to tools for optimizing complex processes or systems, such as flow process charts and, more specifically to the automatic graphical renderings of processes. In an exemplary embodiment, the process is a complex process including hundreds or thousands of operations. In an exemplary embodiment, a device displays a first view that includes a complete progression diagram automatically generated from data stored in a database, and at least some directional lines of the complete progression diagram unintelligibly overlap. In response to a selection of a particular operation in the complete progression diagram, in an exemplary embodiment, the display toggles to a second view that includes a focus diagram. In an exemplary embodiment, an edit to the focus diagram is checked in real-time and rejected if the edit orphans an object currently undergoing the process on a live production line.


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