The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Mar. 15, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

David Stephen Reiner, Lexington, MA (US);

Nihar K. Nanda, Acton, MA (US);

John D. Hushon, Jr., Medfield, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/079 (2013.01);
Abstract

Example embodiments of the present invention provide a method, an apparatus, and a computer program product for scalable monitoring and error handling in multi-latency systems. The method includes gathering events from a multi-latency logical data store comprising a first data store having a first data latency and a second related data store having a second data latency substantially different than the first data latency. Processing then may be performed on the gathered events, with notification of the processed events provided toward downstream queues for consumption. In certain embodiments, consumption comprises holistic error handling; according, in those embodiments holistic error handling of the multi-latency logical data store may be performed according to the notification of the processed gathered events asynchronously from gathering events from the multi-latency logical data store.


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