The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Dec. 04, 2008
Vladimir Klicnik, Oshawa, CA;
Grace Hai Yan Lo, North York, CA;
Curtis Reed Miles, Stouffville, CA;
William Gerald O'farrell, Markham, CA;
Vladimir Klicnik, Oshawa, CA;
Grace Hai Yan Lo, North York, CA;
Curtis Reed Miles, Stouffville, CA;
William Gerald O'Farrell, Markham, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Illustrative embodiments provide a computer-implemented method for a generic data model for event monitoring integration. The computer-implemented method generates monitor application descriptor data for an identified candidate, identifies a target monitor model specification associated with the identified candidate to form an identified target monitor model specification, and responsive to identifying the target monitor model specification, provides the monitor application descriptor data and the identified target monitor model specification, to a monitor model generator. The computer-implemented method further identifies application elements of the identified candidate to be monitored to form identified elements, and generates the identified monitor model for the identified elements to create a monitor-specific output.