The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Jun. 30, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventor:

William Michael Dougherty, Issaquah, WA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01S 11/14 (2006.01); G02B 21/24 (2006.01); G02B 21/33 (2006.01); G02B 21/02 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); G01S 11/14 (2013.01); G02B 21/02 (2013.01); G02B 21/33 (2013.01); G02B 21/34 (2013.01);
Abstract

An optical microscope and method for detecting lens immersion in optical microscopy includes an ultrasound circuit acoustically coupled to both an objective lens and a sample slide of an optical microscope, the ultrasound circuit comprising an ultrasound transmitter and an ultrasound receiver. The optical microscope and method includes transmitting an ultrasound pulse from the ultrasound transmitter to the ultrasound receiver, determining that a transit time of the ultrasound pulse is less than a threshold time, and providing an output signal from the pulse discriminator indicating that the ultrasound pulse is less than the threshold time.


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