The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Jun. 09, 2015
General Electric Company, Schenectady, NY (US);
Zhangyi Zhong, Palo Alto, CA (US);
Chun Zhan, Niskayuna, NY (US);
Kang Zhang, Niskayuna, NY (US);
Daniel Curtis Gray, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
Methods and systems for autofocusing of an imaging system are presented. Provided is an imaging system and an optical interferometry system for generating one or more images corresponding to a target region in a subject. The method provides calibration information that identifies a focal position of the optical interferometry system corresponding to a determined focal position of the imaging system. A subsequent focal position of the imaging system is determined for generating a desired image corresponding to at least one of another target region in the subject and another position of the target region relative to the imaging system based on the calibration information.