The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Sep. 09, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Alan H. Leek, Frisco, TX (US);
Damian M. Szmulewicz, Addison, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 1/24 (2006.01); H04B 17/12 (2015.01); H04B 5/00 (2006.01); G01R 27/26 (2006.01); G01N 27/00 (2006.01); G01V 3/02 (2006.01);
U.S. Cl.
CPC ...
G01V 3/02 (2013.01); G01N 27/00 (2013.01);
Abstract
A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal and a change of a radio-frequency signal at an output of the at least one band pass filter.