The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Jan. 25, 2013
Applicant:

Vista Clara Inc., Mukilteo, WA (US);

Inventors:

Elliot D. Grunewald, Seattle, WA (US);

David O. Walsh, Mukilteo, WA (US);

Assignee:

VISTA CLARA INC., Mukilteo, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/44 (2006.01); G01R 33/32 (2006.01); G01N 24/08 (2006.01); G01V 3/14 (2006.01); G01R 33/341 (2006.01);
U.S. Cl.
CPC ...
G01R 33/448 (2013.01); G01N 24/081 (2013.01); G01R 33/32 (2013.01); G01V 3/14 (2013.01); G01R 33/341 (2013.01); G01R 33/445 (2013.01);
Abstract

NMR relaxation time estimation methods and corresponding apparatus generate two or more alternating current transmit pulses with arbitrary amplitudes, time delays, and relative phases; apply a surface NMR acquisition scheme in which initial preparatory pulses, the properties of which may be fixed across a set of multiple acquisition sequence, are transmitted at the start of each acquisition sequence and are followed by one or more depth sensitive pulses, the pulse moments of which are varied across the set of multiple acquisition sequences; and apply processing techniques in which recorded NMR response data are used to estimate NMR properties and the relaxation times Tand T* as a function of position as well as one-dimensional and two-dimension distributions of Tversus T* as a function of subsurface position.


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