The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Feb. 08, 2012
Applicant:
Ozgur Sinanoglu, Abu Dhabi, AE;
Inventor:
Ozgur Sinanoglu, Abu Dhabi, AE;
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318544 (2013.01); G01R 31/3177 (2013.01); G01R 31/318547 (2013.01); G01R 31/318586 (2013.01);
Abstract
Exemplary method, computer-accessible medium, test architecture, and system can be provided for a partial-scan test of at least one integrated circuit. For example, it is possible to obtain a plurality of test cubes using a first combinational automatic test pattern generation (ATPG) and identify at least one flip-flop of the integrated circuit using the test cubes to convert to a non-scan flip-flop and facilitate the partial-scan test to utilize the cubes without a utilization of a sequential ATPG or a second combinational ATPG.