The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Feb. 10, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Kazuo Nomura, Shiojiri, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01);
Abstract
A motion analysis apparatus includes: a threshold value determining section that determines whether the amount of inertia in a first period is within a threshold value range; a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed.