The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Jul. 17, 2015
The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);
Kiron Mateti, Bloomington, IN (US);
Craig Armes, Washington, IN (US);
Aaron Cole, Bloomington, IN (US);
Josh Borneman, Bloomington, IN (US);
Amanda Lin, Bloomington, IN (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Systems and related methods are provided to perform optical characterization of system under tests (SUT), including one or more optical elements (OE), for various purposes including evaluation of optical resolution needed to distinguish image elements, blur, line of sight jitter, and/or pointing stability. Various testing systems and methods are provided including an embodiment having a vibration loading system (VLS), a first acceleration sensor coupled with the VLS, and a mounting structure adapted to receive the SUT. An illumination target system (ITS) emits light that passes through the SUT OE's lens and is captured by the SUT's imaging system. A light control system controls the ITS based on a plurality of activation commands and a Test Control System (TCS). The TCS receives ITS input through the SUT that is synchronized with acceleration sensor data (e.g. phase of VLS position) and analyzed via real-time or post-processing.