The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Jun. 13, 2012
Applicants:

Dana Yurach, Mendon, MA (US);

Richard Earle, Uxbridge, MA (US);

Catalin Ristache, Brasov, RO;

Inventors:

Dana Yurach, Mendon, MA (US);

Richard Earle, Uxbridge, MA (US);

Catalin Ristache, Brasov, RO;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01D 18/00 (2006.01); G01N 30/00 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01N 30/00 (2013.01); G06F 19/3412 (2013.01); G06F 19/366 (2013.01); H01J 49/0009 (2013.01);
Abstract

Described are techniques for performing qualification protocol testing. A qualification entity category is selected indicating a category of an entity for which a qualification test protocol is generated. One or more qualification tests are selected and included in the qualification test protocol. Test information is specified for the one or more qualification tests. The test information includes first information identifying one or more code modules executed to perform said one or more qualification tests, second information identifying test inputs to said one or more code modules, and third information specifying how to evaluate tests results from executing each of said one or more qualification tests. A qualification protocol structure including said test information is generated.


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