The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Nov. 15, 2011
Applicants:

Adam R. Gerlach, Oregonia, OH (US);

Paul Thomson, Cincinnati, OH (US);

Bruce Walker, Cincinnati, OH (US);

Inventors:

Adam R. Gerlach, Oregonia, OH (US);

Paul Thomson, Cincinnati, OH (US);

Bruce Walker, Cincinnati, OH (US);

Assignee:

ECTOSCAN SYSTEMS, LLC, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01B 11/24 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G06T 7/0046 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A surface data acquisition, storage, and assessment system for detecting and quantifying similarities or differences between stored data and data collected from a scan. The system operates utilizing a method that decreases the time required for calculating a pose estimate thus increasing its performance making it more practical for applications that require real-time operations. In a preferred embodiment the system comprises one or more sensing components for scanning and measuring surface features of an object for determining the identity of the object, and determines differences between data obtained from two or more scans.


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