The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Apr. 20, 2012
Robert J. Greenberg, Los Angeles, CA (US);
Jone Fine, Seattle, WA (US);
Arup Roy, Valencia, CA (US);
Matthew J. Mcmahon, Los Angeles, CA (US);
Mark S. Humayun, Glendale, CA (US);
James David Welland, Valencia, CA (US);
Alan M. Horsager, Los Angeles, CA (US);
Dao Min Zhou, Saugus, CA (US);
Amy Hines, Monterey Park, CA (US);
Sumit Yadav, Los Angeles, CA (US);
Rongqing Dai, Valencia, CA (US);
Robert J. Greenberg, Los Angeles, CA (US);
Jone Fine, Seattle, WA (US);
Arup Roy, Valencia, CA (US);
Matthew J. McMahon, Los Angeles, CA (US);
Mark S. Humayun, Glendale, CA (US);
James David Welland, Valencia, CA (US);
Alan M. Horsager, Los Angeles, CA (US);
Dao Min Zhou, Saugus, CA (US);
Amy Hines, Monterey Park, CA (US);
Sumit Yadav, Los Angeles, CA (US);
Rongqing Dai, Valencia, CA (US);
Second Sight Medical Products, Inc., Sylmar, CA (US);
Abstract
The invention is a method of identifying a preferred location for an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject and array location to array location. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the preferred location. Alternatively, electrode height may be measured directly to predict the preferred location.