The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Jun. 10, 2013
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Suresh Seshadri, West Covina, CA (US);
David Cole, Glendale, CA (US);
Roger M. Smith, La Canada Flintridge, CA (US);
Bruce R. Hancock, Pasadena, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 5/225 (2006.01); H04N 5/378 (2011.01); G09G 3/06 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/004 (2013.01); G09G 3/006 (2013.01); H04N 5/2256 (2013.01); H04N 5/378 (2013.01); G09G 2320/0209 (2013.01); G09G 2320/0219 (2013.01);
Abstract
The effects of inter pixel capacitance in a pixilated array may be measured by first resetting all pixels in the array to a first voltage, where a first image is read out, followed by resetting only a subset of pixels in the array to a second voltage, where a second image is read out, where the difference in the first and second images provide information about the inter pixel capacitance. Other embodiments are described and claimed.