The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
May. 21, 2013
Olympus Corporation, Tokyo, JP;
Motohiro Shibata, Tokyo, JP;
Shinichiro Aizaki, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A microscope system comprises: a stage carrying a sample; an optical system forming an sample image; a driver driving at least the optical system or stage to relatively moves the sample and optical system; an imaging section capturing a reference viewing field image as an image of a predetermined viewing field range of the sample and peripheral viewing field images each being an image of a peripheral viewing field range containing a predetermined region in the predetermined viewing field range and different from the predetermined viewing field range, by the driver moving the relative position of the sample; a correction gain calculator calculating a correction gain of each pixel of the reference viewing field image based on the reference viewing field image and peripheral viewing field image; and a corrector performing shading correction on the reference viewing field image based on the calculated correction gain.