The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Sep. 10, 2014
Applicant:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Inventors:
Mitsuyoshi Kobayashi, Ota, JP;
Risako Ueno, Meguro, JP;
Kazuhiro Suzuki, Minato, JP;
Hiroto Honda, Yokohama, JP;
Honam Kwon, Kawasaki, JP;
Hideyuki Funaki, Shinagawa, JP;
Assignee:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/225 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G02B 3/0037 (2013.01); H04N 5/2257 (2013.01);
Abstract
According to an embodiment, a microlens array for a solid-state image sensing device includes a plurality of microlenses and a state detector. The plurality of microlenses are disposed in an imaging microlens area and is configured to form two-dimensional images. The state detector is disposed on a periphery of the imaging microlens area and is configured to, on an image forming surface of the microlenses, generate images having a smaller diameter than images formed by the microlenses.