The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Oct. 31, 2014
Altera Corporation, San Jose, CA (US);
Peng Li, Palo Alto, CA (US);
Masashi Shimanouchi, San Jose, CA (US);
Hsinho Wu, Santa Clara, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
One embodiment of the present invention relates to a method for built-in self-measurement (BISM) of jitter components. A built-in self-measurement controller on the host integrated circuit (and, in some cases, a slave controller on a partner integrated circuit) may be used to control various switches to form various loopback circuits. A calibrated jittery data pattern is transmitted through each of the various loopback circuits. On-die instrumentation (ODI) circuitry may then be used to measure intrinsic jitter components for each loopback circuit via data representations such as eye-diagrams, or jitter histograms, or bit error ratio bathtub curves. The intrinsic jitter for link components (i.e. the jitter components such as deterministic jitter (DJ), random jitter (RJ), total jitter (TJ)) may then be determined based on the measured intrinsic jitters for the various loopback circuits. Other embodiments and features are also disclosed.