The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Dec. 08, 2014
Applicant:

Mstar Semiconductor, Inc., Hsinchu Hsien, TW;

Inventors:

Fong-Shih Wei, New Taipei, TW;

Ko-Yin Lai, Zhubei, TW;

Chen-Yi Liu, Zhubei, TW;

Tai-Lai Tung, Zhubei, TW;

Assignee:

MStar Semiconductor, Inc., Hsinchu Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04J 11/0023 (2013.01); H04L 25/03821 (2013.01); H04L 2025/03414 (2013.01);
Abstract

A method for determining impulsive interference applicable to an orthogonal frequency division multiple access (OFDMA) signal receiver is provided. The receiving method includes calculating a subcarrier noise of a first symbol, calculating a subcarrier noise of a second symbol, calculating a first ratio of the subcarrier noise of the first symbol to the subcarrier noise of the second symbol, determining whether the ratio is greater than a first threshold, and recognizing that the first symbol suffers from impulsive interference when the first ratio is greater than the first threshold.


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