The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Sep. 07, 2011
Applicant:
Yoshihito Mizuno, Nagoya, JP;
Inventor:
Yoshihito Mizuno, Nagoya, JP;
Assignee:
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/058 (2006.01); H01L 35/34 (2006.01); G01K 7/02 (2006.01); H01L 35/20 (2006.01); H01L 35/32 (2006.01); H01L 35/28 (2006.01); G01K 7/01 (2006.01);
U.S. Cl.
CPC ...
H01L 35/34 (2013.01); G01K 7/01 (2013.01); G01K 7/02 (2013.01); H01L 35/20 (2013.01); H01L 35/28 (2013.01); H01L 35/32 (2013.01);
Abstract
A semiconductor device that is equipped with a semiconductor substrate, a composite metal film, and a detection terminal is provided. The composite metal film is formed on a surface or a back face of the semiconductor substrate, and has a first metal film, and a second metal film that is joined to the first metal film and is different in Seebeck coefficient from the first metal film. The detection terminal can detect a potential difference between the first metal film and the second metal film.