The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Dec. 07, 2007
Applicants:

Roger Giles, Holmfirth, GB;

Michael Sudakov, St. Petersburg, RU;

Hermann Wollnik, Santa Fe, NM (US);

Inventors:

Roger Giles, Holmfirth, GB;

Michael Sudakov, St. Petersburg, RU;

Hermann Wollnik, Santa Fe, NM (US);

Assignee:

SHIMADZU CORPORATION, Nakagyo-Ku, Kyoto, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/403 (2013.01); H01J 49/4295 (2013.01);
Abstract

A time-of-flight mass spectrometer () comprises an ion source a segmented linear ion device () for receiving sample ions supplied by the ion source and a time-of-flight mass analyzer for analyzing ions ejected from the segmented device. A trapping voltage is applied to the segmented device to trap ions initially into a group of two or more adjacent segments and subsequently to trap them in a region of the segmented device shorter than the group of segments. The trapping voltage may also be effective to provide a uniform trapping field along the length of the device ().


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