The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Mar. 18, 2015
Applicant:

Kiichiroh Saitoh, Kanagawa, JP;

Inventor:

Kiichiroh Saitoh, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01S 17/02 (2006.01); G01S 17/93 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0075 (2013.01); G01S 17/026 (2013.01); G01S 17/936 (2013.01); G06T 7/0057 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20228 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A disparity deriving apparatus for deriving disparity of an object based on a captured reference image of the object and a captured comparison image of the object includes a calculator to calculate costs between a first reference area in the reference image and each one of corresponding areas in the comparison image, and costs between a second reference area and each one of corresponding areas corresponding to the second reference area in the comparison image; a synthesizer to synthesize the costs of the first reference area, and the costs of the second reference area as synthesis costs; a deriving unit to derive a disparity value of the object captured in the first reference area based on the synthesized synthesis cost; and an output unit to output the derived disparity value and a specific cost of the first reference area identified by the derived disparity value.


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