The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Aug. 11, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Manoj Dusanapudi, Bangalore, IN;

Madhusudan Kadiyala, Bangalore, IN;

John Paul, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/36 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06N 99/005 (2013.01);
Abstract

Embodiments of the present invention provide methods, computer program products, and systems for generating comprehensive test cases covering new events yet to be covered. Embodiments of the present invention can be used to receive a request to generate a test case, wherein the request comprises a coverage schema associated with a first set of events to be covered in the generated test case. Embodiments of the present invention includes updating the coverage schema, wherein the updating the coverage schema comprises adding a second set of events to be covered in the generated test case and generating constraints used to satisfy requirements for meeting the first set of events and the second set of events in the updated coverage schema. Embodiments of the present invention can generate a test case using the generated constraints and the updated coverage schema.


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