The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Sep. 30, 2014
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Yael Shur, Herzlia Pituach, IL;
Eyal Gurgi, Herzlia Pituach, IL;
Moshe Neerman, Herzlia Pituach, IL;
Naftali Sommer, Herzlia Pituach, IL;
Assignee:
APPLE INC., Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/10 (2006.01); G11C 11/56 (2006.01); G11C 16/26 (2006.01); G11C 29/00 (2006.01); G11C 29/42 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/073 (2013.01); G11C 11/5642 (2013.01); G11C 11/5692 (2013.01); G06F 11/1012 (2013.01); G06F 11/1072 (2013.01); G11C 16/26 (2013.01); G11C 29/00 (2013.01); G11C 29/42 (2013.01);
Abstract
A method for data storage includes reading from a memory device data that is stored in a group of memory cells as respective analog values, and classifying readout errors in the read data into at least first and second different types, depending on zones in which the analog values fall. A memory quality that emphasizes the readout errors of the second type is assigned to the group of the memory cells, based on evaluated numbers of the readout errors of the first and second types.