The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Dec. 04, 2013
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Cole Wilson, Everett, WA (US);

Jon Peterson, Everett, WA (US);

Benjamin Avery, Bellingham, WA (US);

Oleksandr Hoshtanar, Lviv, UA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G06F 2203/04111 (2013.01); G06F 2203/04112 (2013.01);
Abstract

Apparatuses and methods of sense arrays with non-uniform patterns are described. One capacitive-sense array includes a first set of electrodes and a second set of electrodes. The first set of electrodes intersect the second set of electrodes to form a unit cells each corresponding to an intersection of a pair of electrodes comprising one electrode from the first set and one electrode from the second set. At one of the second set of electrodes includes a non-uniform conductive pattern including a first region being located at the intersection of the respective unit cell and a distal region being at a location within the respective unit cell that is farther away from the intersection than the first region. The first region includes a first conductive surface area and the distal region includes a second conductive surface area that is greater than the first conductive surface area.


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