The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Jun. 26, 2013
Applicants:
DE He Weng, Shenzhen, CN;
Qiong Zhang, Shenzhen, CN;
Inventors:
De He Weng, Shenzhen, CN;
Qiong Zhang, Shenzhen, CN;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 33/565 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 33/4822 (2013.01); G01R 33/565 (2013.01); G01R 33/482 (2013.01); G01R 33/4824 (2013.01);
Abstract
In a trajectory correction method and apparatus for k-space data points in magnetic resonance imaging, a magnetic resonance data acquisition unit is operated to execute a sampling sequence to obtain k-space to be corrected. Empirical points are selected used to divide k-space to be corrected into a central region and a peripheral region. The trajectories of the data points in the central region and the peripheral region are corrected and the sampling sequence is executed again, with the corrected trajectories, to obtain corrected k-space.