The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Mar. 05, 2014
Applicant:
Okinawa Institute of Science and Technology School Corporation, Okinawa, JP;
Inventors:
Faisal Mahmood, Okinawa, JP;
Lars-Göran Wallentin Öfverstedt, Okinawa, JP;
Bo Ulf Skoglund, Okinawa, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 11/006 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/42 (2013.01); G01N 2223/612 (2013.01); G06T 2211/432 (2013.01);
Abstract
Computerized method and system for improving 3D reconstruction images involves applying the Extended Field Iterative Reconstruction Technique (EFIRT) to remove correlated noise, in addition to with COMET (constrained maximum relative entropy tomography) or other regularization techniques to eliminate uncorrelated noise, wherein the EFIRT is applied by performing a set of successive reconstructions on an extended field larger than a region of interest (ROI); and extracting and averaging the ROI from said set of successive reconstructions.