The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Dec. 21, 2012
Applicant:

Mitsubishi Heavy Industries Machinery Technology Corporation, Hiroshima-shi, Hiroshima, JP;

Inventors:

Makoto Tachibana, Hiroshima, JP;

Jiro Agawa, Hiroshima, JP;

Morihiro Imamura, Hiroshima, JP;

Tatsuya Ueda, Hiroshima, JP;

Yoshinori Miyamoto, Hiroshima, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01); G01M 17/02 (2006.01); G01M 1/02 (2006.01); G01B 11/24 (2006.01); G01M 1/32 (2006.01); G01M 1/22 (2006.01); G01M 1/16 (2006.01);
U.S. Cl.
CPC ...
G01M 17/021 (2013.01); G01M 17/027 (2013.01); G01B 11/24 (2013.01); G01M 1/02 (2013.01); G01M 1/16 (2013.01); G01M 1/225 (2013.01); G01M 1/326 (2013.01);
Abstract

A tire testing apparatus includes: a lower rim that is formed with a lower through hole, and a rim-side inclined surface that increases in diameter in a downward direction of an inner peripheral surface of a lower end portion of the lower through hole; an upper rim that is held to face the lower rim; an insertion part capable of being inserted through the lower through hole; and an apparatus-side inclined surface that is provided at a lower end portion of the insertion part, increases in diameter from an outer peripheral surface of the insertion part in the downward direction, and is capable of coming into contact with the rim-side inclined surface.


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