The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Jul. 29, 2015
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Anne M. Mason, Palo Alto, CA (US);

Bryan McDonald, Monte Sereno, CA (US);

Shawn X. Arnold, San Jose, CA (US);

Matthew Casebolt, Fremont, CA (US);

Dennis R. Pyper, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); G01L 3/14 (2006.01);
U.S. Cl.
CPC ...
G01L 1/22 (2013.01); G01L 3/1457 (2013.01); G01L 1/2262 (2013.01); G01L 1/2287 (2013.01);
Abstract

A printed circuit board may have embedded strain gauges. A strain gauge may be formed from a metal trace on a polymer substrate. The metal trace may form a variable strain gauge resistor that is incorporated into a bridge circuit for a strain gauge. The printed circuit may have a rigid printed circuit layer with a recess that receives the polymer substrate. Metal pads on the polymer substrate may be coupled to respective ends of the variable strain gauge resistor. The rigid printed circuit substrate with the recess may be laminated between additional rigid printed circuit layers. Vias may be formed through the additional rigid printed circuit layers to contact the metal pads. Embedded strain gauges may be used in gathering strain data when strain is imparted to a printed circuit during use of the printed circuit in an electronic device or during testing.


Find Patent Forward Citations

Loading…